中文簡(jiǎn)介

《IEEE可靠性事務(wù)》是一份關(guān)于可靠性和相關(guān)學(xué)科的參考期刊，包括但不限于:可維護(hù)性、故障物理學(xué)、壽命測(cè)試、預(yù)測(cè)、可靠性設(shè)計(jì)和制造、系統(tǒng)的可靠性、網(wǎng)絡(luò)可用性、任務(wù)成功、保證、安全以及各種有效性度量。符合出版資格的主題范圍從硬件到軟件，從材料到系統(tǒng)，從消費(fèi)和工業(yè)設(shè)備到制造工廠，從個(gè)別項(xiàng)目到網(wǎng)絡(luò)，從使事情變得更好的技術(shù)到預(yù)測(cè)和測(cè)量該領(lǐng)域行為的方法。作為一門(mén)支持新技術(shù)和現(xiàn)有技術(shù)的工程學(xué)科，我們不斷擴(kuò)展到保險(xiǎn)科學(xué)的新領(lǐng)域。

　　英文簡(jiǎn)介

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.

　　近年期刊自引率趨勢(shì)圖

　　JCR分區(qū)

JCR分區(qū)等級(jí)	JCR所屬學(xué)科	分區(qū)	影響因子
Q1	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	Q1	5.883
	COMPUTER SCIENCE, SOFTWARE ENGINEERING	Q1
	ENGINEERING, ELECTRICAL & ELECTRONIC	Q1

　　近年期刊影響因子趨勢(shì)圖

　　CiteScore數(shù)值

CiteScore	SJR	SNIP	學(xué)科類別	分區(qū)	排名	百分位
9.20	1.253	2.196	大類：Engineering 小類：Safety, Risk, Reliability and Quality	Q1	8 / 171	95%
			大類：Engineering 小類：Electrical and Electronic Engineering	Q1	77 / 708	89%

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