中文簡介

X射線譜致力于快速發表論文處理x射線光譜法的理論和應用使用電子,X射線光子,質子,γ和γ-X來源。涵蓋了先進的技術，方法和設備，這個建立的期刊為討論更復雜的x射線分析方法提供了理想的平臺。包括波長和能量色散系統，以及一系列數據處理方法，從最簡單的到非常復雜的軟件程序。有關X射線光譜分析方法在結構分析方面的應用的論文，以及涉及環境分析和監測、藝術和古物學研究、礦物學、法醫學、地質學、表面科學和材料分析、生物醫學和藥物應用等廣泛領域的應用論文，也都是專題報道。

　　英文簡介

X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.

　　近年期刊自引率趨勢圖

　　JCR分區

JCR分區等級	JCR所屬學科	分區	影響因子
Q3	SPECTROSCOPY	Q3	1.234

　　近年期刊影響因子趨勢圖

　　CiteScore數值

CiteScore	SJR	SNIP	學科類別	分區	排名	百分位
2.50	0.271	0.679	大類：Chemistry 小類：Spectroscopy	Q3	56 / 77	27%

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