中文簡介
光譜化學學報B部分:原子光譜學,旨在快速出版的原始工作和評論在以下領域:原子發射光譜(AES)、原子吸收光譜(AAS)和原子熒光光譜(AFS);用于無機分析,包括火花源(SS-MS)、電感耦合等離子體(ICP-MS)、輝光放電(GD-MS)和二次離子質譜(SIMS)。激光誘導原子光譜用于無機分析,包括非線性光學激光光譜、覆蓋激光增強電離(LEI)、激光誘導熒光(LIF)、共振電離光譜(RIS)和共振電離質譜(RIMS);激光誘導擊穿光譜(LIBS);激光燒蝕電感耦合等離子體原子發射光譜(LA-ICP-AES)和激光燒蝕電感耦合等離子體質譜(LA-ICP-MS)。X射線光譜法、X射線光學及顯微分析,包括X射線熒光光譜法(XRF)及相關技術,特別是全反射X射線熒光光譜法(TXRF)、同步輻射激發全反射X射線光譜法(SR-TXRF)。涉及(i)基本原理、(ii)方法發展、(iii)儀器和(iv)應用的手稿可提交出版。重點放在與“光譜化學分析”有關的論文上。主要科目將包括與產生原子或質譜有關的物理和化學過程的理論或實驗研究;原子數據的測定;光譜化學源診斷;在上述光譜分析領域中使用的完整儀器系統、儀器部件或設備的基本原理、設計或性能;定性和定量分析是指用一種方法或多種方法的組合完成分析程序,或部分完成程序:抽樣、制樣、進樣、檢測、數據采集和處理(包括校準和統計評價);分析性能和優點分析圖:檢測限和測定限、選擇性、精密度、準確度、干擾。定期發表關于某一特別重要的主題或分析領域的權威和全面的評論文章。此外,歡迎就一個領域或專題的現況和未來前景作較短、簡明的評論或觀點,特別是與發展新的分析方法或更好地了解其基本基本原則有關的領域或專題。課程回顧,說明了深入的基本概念在原子光譜和分析原子光譜,也發表了。描述光譜技術在分析中的應用的文章也將被考慮。然而,在這種情況下,手稿的光譜味道應該是實質性的:不應該只提交分析配方或強調分離和預濃縮技術的論文。最后,根據編輯的自由裁量權,將考慮加快發表涉及新的重要概念、儀器發展或應用的短篇論文。
英文簡介
Spectrochimica Acta Part B-Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.The emphasis is on papers having a relationship with "spectrochemical analysis". The main subjects will include theoretical or experimental studies of the physical and chemical processes connected with the generation of atomic or mass spectra; the determination of atomic data; diagnostics for spectrochemical sources; the fundamentals, design or performance of complete instrumental systems, components of instruments, or devices used in any of the above stated fields of spectrometry; qualitative and quantitative analysis in the sense of complete analytical procedures using a single method or a combination of methods, or parts of complete procedures: sampling, sample preparation, sample introduction, detection, data acquisition and handling (including calibration and statistical evaluation); analytical performance and analytical figures of merit: limits of detection and limits of determination, selectivity, precision, accuracy, interferences.Authoritative and comprehensive review articles, dedicated to a particularly important topic or field of analysis, are published regularly. In addition, shorter, concise reviews or viewpoints focusing on the current status and future prospects of a field or topic particularly relevant to the development of a new analytical methodology or to a better understanding of its fundamental underlying principles are welcome. Tutorial reviews, illustrating in depth fundamental concepts in atomic spectroscopy and analytical atomic spectroscopy, are also published.Articles describing an application of a spectroscopic technique to analysis will also be considered. In this case, however, the spectroscopic flavor of the manuscript should be substantial: mere analytical recipes or papers emphasizing separation and pre-concentration techniques should not be submitted. Finally, to the editors' discretion, accelerated publication of short papers dealing with new important concepts, instrumental developments or applications will be considered.
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