中文簡介

紅外、毫米波和太赫茲波雜志提供了一個同行評審的平臺，用于在30 GHz到30 THz的頻率窗口中快速傳播原始的、高質量的研究。涉及的主題包括:源、檢測器和其他設備;系統、光譜學、傳感、電磁波與物質的相互作用、應用、計量和通信。提交給期刊的稿件應該討論紅外、毫米波和太赫茲波領域的重大進展。稿件可提交下列類別之一:書信:社區特別感興趣的短文。將加快對這一手稿類別的審查進程。來源:包括基于光導天線及相關技術的系統、共振隧穿二極管、微波器件、真空管源、自由電子激光器、同步加速器、大功率微波源、氣體激光器、量子級聯激光器及參數下變頻源。探測器:THz探測器，探測器陣列或探測器的一部分，如混頻器或天線。設備:調制器、反射器、濾波器和波導以及基于超材料的設備。系統:包括整個發射-接收系統，成像系統，表征系統，還包括數據提取算法和計量問題。光譜學:THz波與所有物質狀態的相互作用;包括固體、液體、氣體和等離子體的THz光譜。應用:討論可能的應用，例如工業檢驗、生物醫學傳感、材料科學和通信的手稿。

　　英文簡介

The Journal of Infrared, Millimeter, and Terahertz Waves offers a peer-reviewed platform for the rapid dissemination of original, high-quality research in the frequency window from 30 GHz to 30 THz. The topics covered include: sources, detectors, and other devices; systems, spectroscopy, sensing, interaction between electromagnetic waves and matter, applications, metrology, and communications. Manuscripts submitted to the Journal should discuss a significant advancement to the field of infrared, millimeter, and terahertz waves.Manuscripts can be submitted to one of the following categories:Letters: Short articles of particular interest to the community. The review process will be expedited for this manuscript category.Sources: Including systems based on photoconductive antennas and related techniques, resonant tunnelling diodes, microwave devices, vacuum tube based sources, free electron lasers, synchrotrons, high power microwave sources, gas lasers, quantum cascade lasers and sources relying on parametric down conversion.Detectors: THz detectors, detector arrays or part of detectors such as mixers or antennas.Devices: Modulators, reflectors, filters and waveguides as well as metamaterial-based devices.Systems: Including entire emitter-receiver systems, imaging systems, characterization of systems, but also data extraction algorithms and metrology problems.Spectroscopy: Interaction between THz waves and all states of matter; includes THz spectroscopy on solids, liquids, gases, and plasmas.Applications: Manuscripts which discuss possible applications e.g. e.g. for industrial inspection, bio-medical sensing, material science, and communications.

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